Product Overview
Its advanced optical correction restricts full-field geometric distortion to only 0.01%, paired with outstanding MTF resolution up to 250 lp/mm at the optical axis and 160 lp/mm at the image edge. Adopting dual-side telecentric optical architecture, it eliminates parallax deviation completely to deliver fixed true magnification. This lens is the core imaging solution for micro-component high-precision inspection, widely deployed in semiconductor wafer detection, miniature electronics AOI, medical precision parts, micro hardware and new energy micro-pole piece production lines.
Distinctive Core Product Features
- Dual-Side Bi-Telecentric Optical Design, Zero Parallax Measuring Error
Parallel chief ray design on object and image sides keeps magnification constant regardless of minor vertical jitter or tilt of workpieces within depth of field. It fundamentally eliminates perspective-induced measurement drift, realizing repeatable sub-pixel precision critical for micron-level industrial metrology.
- Industry Top-Tier Ultra-Low Distortion (≤0.01%)
Full-aperture multi-group aberration control limits distortion to merely 0.01%, far superior to ordinary telecentric lenses. It restores the true geometric contour of tiny workpieces without edge stretching, compression or deformation, greatly improving the stability of edge extraction for vision measurement algorithms.
- Dual Compatibility for 16K 3.5μm & 16K 5μm Ultra-Fine Pixel Sensors
High MTF optical performance matches both 5μm standard and 3.5μm ultra-fine pixel 16K line scan cameras, fully unlocking the ultra-high resolution of high-end line scan sensors to capture micro scratches, pinholes, coating flaws and ultra-fine dimensional tolerances without detail loss across the entire scanning width.
- Large Adjustable F3.8–F22 Iris for Superior Light Throughput & DOF Control
The ultra-wide adjustable aperture balances light intake and depth of field freely. Large F3.8 aperture provides abundant exposure for dark, low-reflectivity micro-components in dim factory environments; narrow F22 extends depth of field to adapt workpieces with slight surface height differences, compatible with coaxial line lights, diffuse dome lights and linear array lighting systems.
- Optimized 450–589mm Medium Working Distance for Compact Inspection Equipment
Moderate working distance saves mechanical layout space inside automated inline inspection stations, ideal for compact small-part detection machines and bench-top precision measuring instruments without long-distance extension tubes.
- Lockable All-Metal Industrial Housing with Standard M72 Mount
Robust eco-friendly metal lens barrel is equipped with dedicated locking screws for aperture and focusing rings, preventing optical parameter drift caused by factory vibration and temperature fluctuation. Universal M72 threaded mount fits all mainstream brands of 16K line scan cameras for seamless equipment integration.
- Uniform Full-Field Illumination & Broadband Anti-Reflection Coating
Optimized vignetting correction ensures consistent brightness from image center to edge, eliminating dark corners and reducing extra image pre-processing workload for vision software. Broad-spectrum AR coating delivers high contrast imaging under white, blue and near-infrared industrial illumination.
Most Important Core Functions
- Micro Component Ultra-High Precision Non-Contact Dimensional Metrology
Accurately measure micro-hole spacing, thread pitch, part outline tolerance and ultra-thin thickness of semiconductor wafers, miniature connectors, precision micro-screws and tiny medical implants. Constant telecentric magnification eliminates parallax deviation to output stable, repeatable measuring data.
- Micro Surface Blind-Zone-Free Ultra-Fine Defect Inspection
Amplify invisible micro surface features to detect nanoscale scratches, micro pinholes, coating unevenness, tiny burrs and foreign particles on electronic chips, precision hardware and lithium battery micro pole pieces, removing the need for additional microscopic auxiliary optics.
- Stable High-Speed Inline Continuous Mass Production Imaging
Strong depth-of-field tolerance adapts minor vertical fluctuation of conveyed micro workpieces during high-speed running. The rigid optical-mechanical structure maintains consistent imaging quality for 24/7 non-stop mass production, lowering equipment downtime caused by frequent lens re-calibration.
- High-Fidelity Micro Contour Restoration for Automated Sorting & Robot Visual Guidance
Ultra-low distortion truly reproduces the tiny edge profile of miniature workpieces, supporting high-precision contour matching, automatic dimensional sorting and robot visual positioning for precision assembly production lines.
- Universal Compatibility With Global Mainstream Machine Vision Ecosystems
Standard M72 mount matches all mainstream 16K line scan camera models; captured images are fully compatible with Halcon, VisionPro, OpenCV and other mainstream image analysis software, lowering secondary development difficulty for system integrators.
Typical Application Industries & Scenarios
- Semiconductor: Wafer surface micro-defect detection, chip micro-dimensional measurement
- Precision Electronics: Miniature connector, micro circuit component AOI inspection
- Medical Manufacturing: Tiny medical implant part profile gauging
- Precision Hardware: Micro screw, miniature fastener thread & appearance inspection
- New Energy: Lithium battery micro pole piece surface flaw scanning
- Lab Precision Measurement: Bench-top micro-component dimensional calibration equipment
